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Hard X-ray emission spectroscopy (XES) is an important analytical technique used to study the electronic structure and chemical properties of materials. Hard X-rays have high energy and are able to penetrate deep into the sample, making XES a powerful tool for probing deep information in materials. The main application areas of XES include:

• Chemical state analysis: XES is able to provide direct information about the chemical state of elements in a sample, such as oxidation states and coordination environments, which is essential for understanding the chemical properties and reaction mechanisms of materials.

• Materials Science: In the development and research of new materials, XES is used to analyze the electronic structure, band structure, and valence band information of materials, which are important for optimizing the electrical and optical properties of materials.

• Catalyst research: XES technology can probe the active site and electronic environment of catalysts at the atomic level, which provides the possibility of designing more efficient catalysts.

• Environmental Science: By analyzing the chemical state of pollutants in environmental samples, such as soil, water, and atmospheric particles, XES helps to understand the sources, migration, and transformation processes of pollutants.

• Energy Materials Research: XES provides critical electron-level information to optimize the performance of these energy conversion and storage devices when studying the electronic structure and working mechanisms of batteries, fuel cells, and solar materials.

• Biomedical: XES is used to study the coordination environment of metal ions in biomolecules, such as proteins and enzymes, which plays an important role in understanding the function of biomolecules and designing drugs.

• Earth Sciences: In Earth and Planetary Science Research, XES can analyze mineral and rock samples, revealing their composition and environmental conditions during their formation.

Hard X-ray emission spectroscopy (XES) technology is playing an increasingly important role in scientific research and industrial applications due to the unique elemental and chemical state information it provides, especially when it is not possible to directly probe deep or trace elements in a sample using other techniques. With the advancement of measurement technology, XES is expected to find applications in more areas in the future.

Instrument principle

Instrument parameters

• Detection energy range: 5~15 keV

• It can measure 3 d element K edge and 5d transition metalL-edge, and actinide L-edge fluorescence peaks

• Electron-hole efficiency: ≥1×10¹¹;

• Energy resolution: ≤1.5 eV@Cu Ka;

• Limit of detection: ≤0.1%wt;

• Repeatability: Repetitive scan energy offset < 50 meV;

• Helium chamber to reduce X-ray air absorption;

• High-purity Si or Ge crystal monochromator to ensure energy resolution in the all-round region

• Equipped with an in-situ cell system, a variety of modular in-situ test systems can be designed, and various in-situ test systems such as high temperature and low temperature, heterogeneous catalysis, and electrocatalysis can be integrated, which can realize modular switching;

• Including a data processing system, the emission spectrum data is automatically output during the acquisition process without additional switching.

Reference data